3

Calculation of STM profiles for nanometrology

Year:
1995
Language:
english
File:
PDF, 396 KB
english, 1995
13

Applications of scanning electrical force microscopy

Year:
1997
Language:
english
File:
PDF, 242 KB
english, 1997
25

On Integeral Characteristics of the Electron Structure of Crystalline Surfaces

Year:
1978
Language:
english
File:
PDF, 307 KB
english, 1978
26

Adiabatic Variational Calculation of the Lattice Relaxation at Metal Surfaces

Year:
1980
Language:
english
File:
PDF, 904 KB
english, 1980
30

Detecting work-function differences in scanning tunneling microscopy

Year:
1999
Language:
english
File:
PDF, 351 KB
english, 1999